CR9000 Measurement & Control System
- CR9000 Measurement & Control System replaced by the CR9000X
- Manufactured from 1995-2004
- Intended for applications requiring rapid scan rates and/or a large number of channels
- Modular, multi-processor base system includes CPU, power supply and A/D modules
- System throughput was 100,000 samples/second
- Up to nine I/O Modules could be used to configure a system for specific applications.
- 16-bit resolution
- On-board, BASIC-like programming language
- PC9000 Support Software provided program generation, data graphics, and analysis
- 2 M Flash EEPROM
- 2 M Static RAM
