CR9000 Measurement & Control System
CR9000 Measurement & Control System

 

  • CR9000 Measurement & Control System replaced by the CR9000X
  • Manufactured from 1995-2004
  • Intended for applications requiring rapid scan rates and/or a large number of channels
  • Modular, multi-processor base system includes CPU, power supply and A/D modules
  • System throughput was 100,000 samples/second
  • Up to nine I/O Modules could be used to configure a system for specific applications. 
  • 16-bit resolution
  • On-board, BASIC-like programming language
  • PC9000 Support Software provided program generation, data graphics, and analysis
  • 2 M Flash EEPROM
  • 2 M Static RAM

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